T.O. 33B-1-14-854.8.1.2 GeneralLimitationsofPlatingThicknessMeasurement.The use of eddy current techniques for thickness measurement is confined to thin materials. This limitation resultsfrom the inability of the eddy current field to penetrate deeply into conductive materials. The effective depth ofpenetration, and therefore the thickness that can be measured, decreases as the conductivity and/or permeability of themetal increases. To determine the thickness of plating or coatings on metallic substrates, a difference must exist inconductivity or permeability between the surface material and base material. Increased sensitivity is obtained, as thedifferences between plating and substrate conductivity or permeability become larger. For nonconductive coatings, thesensitivity improves with increasing frequency. Larger probe diameters provide greater sensitivity for measurement ofthicker plating. A summary of the effects of an increase in material properties and inspection variables on thesensitivity and range of thickness measurements is presented in Table 4-8.Table 4-8. Effects of Material and Inspection Variables on the Sensitivity and Range of ThicknessMeasurements.VariableIncreased Sensitivity of Measurement Range of MeasurementConductivityIncreases for thin metallic parts and plating. Increasesthroughout effect range for nonconductive coatings.Decreases for metallic materials.Increases for nonconductive coatings.PermeabilityIncreases for thin metallic parts and plating. Decreases forthick metallic parts and plating. Increases throughout fornonconductive coatings.Decreases for metallic materials.Increases for nonconductive coatings.FrequencyIncreases for thin metallic parts and plating. Decreases forthicker metallic parts and plating. Increases throughoutthe effective range for nonconductive coatings.Decreases for metallic materials.Increases for nonconductive coatings.ProbeDiameterIncreases for thicker metallic parts and plating andthroughout effective range for nonconductive coatings.Increases for metallic parts, plating,and nonconductive coatings.4.8.1.3 TestSystems.A wide variety of specialized equipment is manufactured for thickness measurement. Many such instruments areoptimized for one ortwo types of applications. Examples include instruments designed to measure nonconductivecoatings on nonmagnetic metals or instruments for measuring nonmagnetic plating on a magnetic substrate. Becauseof limited requirements, such specialized equipment is usually not available for use in the field. In most cases, general-purpose instruments may be adapted for thickness measurement. Many of the meter type instruments can be used for awide variety of thickness measurement operations. Impedance plane analysis equipment is very useful for thicknessmeasurement. Phase change is more nearly linear with increasing depth of penetration, thereby providing moreconsistent sensitivity and accuracy over the entire range of measurement.4.8.1.4 ThicknessMeasuringProcedures.Before thickness measurement can be performed, the eddy current measurement procedures should be carefullyestablished and proven to ensure accuracy and reliability. Curves should be prepared to relate instrument readings toknown thickness standards. A sufficient number of samples within the thickness range to be measured must be used inpreparing the curves to ensure that a smoothly increasing or decreasing curve will be obtained. The type and number ofstandards necessary for instrument standardization must be defined. The limitations of the procedures in terms ofmaterial and dimension applicability must be established and noted in the procedures. Because instrument settings fora specific inspection may vary slightly with test conditions, different probes, and variations between instruments,specific instrument settings are not usually provided for these applications.4.8.2 MeasurementofTotalMetalThickness.4.8.2.1 ApplicationsofTotalThicknessMeasurement.The primary use of eddy current techniques for measuring the total thickness of metal parts is to detect corrosion on thefar sides or between layers of structure. However, this technique can also be employed to establish the thickness of thin
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